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Kilometer-range depth imaging at 1550 nm wavelength using an InGaAs/InP single-photon avalanche diode detector

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posted on 2023-06-09, 13:34 authored by Aongus McCarthy, Ximing Ren, Adriano Della Frera, Nathan R Gemmell, Nils J Krichel, Carmelo Scarcella, Alessandro Ruggeri, Alberto Tosi, Gerald S Buller
We have used an InGaAs/InP single-photon avalanche diode detector module in conjunction with a time-of-flight depth imager operating at a wavelength of 1550 nm, to acquire centimeter resolution depth images of low signature objects at stand-off distances of up to one kilometer. The scenes of interest were scanned by the transceiver system using pulsed laser illumination with an average optical power of less than 600 µW and per-pixel acquisition times of between 0.5 ms and 20 ms. The fiber-pigtailed InGaAs/InP detector was Peltier-cooled and operated at a temperature of 230 K. This detector was used in electrically gated mode with a single-photon detection efficiency of about 26% at a dark count rate of 16 kilocounts per second. The system’s overall instrumental temporal response was 144 ps full width at half maximum. Measurements made in daylight on a number of target types at ranges of 325 m, 910 m, and 4.5 km are presented, along with an analysis of the depth resolution achieved.

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Publication status

  • Published

File Version

  • Published version

Journal

Optics Express

ISSN

1094-4087

Publisher

Optical Society of America

Issue

19

Volume

21

Page range

22098-22113

Department affiliated with

  • Engineering and Design Publications

Full text available

  • Yes

Peer reviewed?

  • Yes

Legacy Posted Date

2018-05-30

First Open Access (FOA) Date

2018-05-31

First Compliant Deposit (FCD) Date

2018-05-31

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