Reflectance of the dielectric layers containing metal nanoparticles formed by ion implantation

Composites with silver nanoparticles have been prepared by ion implantation in soda–lime glass at 60 keV to a dose of 7.0 × 1016 ion/cm2 at a current density of 10 µA/cm2. The silver profile distribution was determined by Rutherford backscattering spectroscopy. Optical properties of composites were characterized by reflectance measured from both the implanted and the rear face of the sample. For modelling of reflectivity spectra a multilayer structure was considered and a matrix method using complex Fresnel coefficients was applied. Dielectric permeabilities of composite layers were calculated using the Maxwell–Garnet effective medium theory. Quality agreement between theoretical and experimental reflectivity spectra was achieved by accounting for the non-uniform silver concentration distribution with depth in the implanted glass surface.