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OLED Degradation Modelling
presentation
posted on 2023-06-07, 20:08 authored by Paul NewburyPaul Newbury, David Antonio-Torres, Paul ListerImage processing techniques and technological characterisation of OLEDs have been used to develop a visual model of OLED degradation. This model allows the evaluation of degradation profiles and the estimation of the effects of differential aging. Assessment of degradation is enhanced with the modelling of some typical subpixel architectures
History
Publication status
- Published
ISSN
1083-1312Publisher
Society for Information DisplayPages
4.0Presentation Type
- paper
Event name
25th International Display Research Conference (EuroDisplay 2005)Event location
Edinburgh, UKEvent type
conferenceDepartment affiliated with
- Informatics Publications
Notes
Originality: New research into implementing complex degradation profile models for Organic Light Emitting Diodes (OLED). Extends existing physical research by producing significantly more accurate degradation models than are required for compensation modelling. Enables graphical interfaces to be tested and their susceptibility to degradation simulated without the construction of expensive prototypes. Rigour: Applies a large set of profiles calculated from pre-existing physical data to the prediction of degradation effects with different interfaces. Significance: Makes prediction of degradation effects with different interfaces achievable and has a valuable impact on the choice of OLEDs in marketable electronic devices. Particularly small mobile devices. Impact: Philips Research (a key contributor to the initial research in this area) has shown interested in the interface design implications of this research for small displays. Outlet: Society for Information Display International Display Research Conference is the leading European conference in the field of display technology. The SID has been in existence since 1962 and this is the 25th annual conference. Citations: New material has mainly industrial applications.Full text available
- No
Peer reviewed?
- Yes
